Method for manufacturing magnetic head device

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United States of America Patent

PATENT NO 7159303
SERIAL NO

11371244

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Abstract

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The magnetoresistance effect element is of a multilayered structure having at least magnetic layers and an intermediate layer of an insulating material, a semiconductor or an antiferromagnetic material against the magnetic layers, and the magnetoresistance effect element has terminals formed at least on the opposite magnetic layers, respectively, so that a current flows in the intermediate layer. The film surfaces of all the magnetic layers constituting the magnetoresistance effect element are opposed substantially at right angles to the recording surface of a magnetic recording medium. Therefore, the area of the magnetic layers facing the recording surface of the magnetic recording medium can be extremely reduced, and thus the magnetic field from a very narrow region of the high-density recorded magnetic recording medium can be detected by the current which has a tunneling characteristic and passes through the intermediate layer.

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Patent Owner(s)

Patent OwnerAddress
HITACHI GLOBAL STORAGE TECHNOLOGIES LTDODAWARA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akagi, Kyo Fuchu, JP 37 576
Fukuoka, Hirotsugu Hitachiota, JP 28 505
Futamoto, Masaaki Kanagawa-ken, JP 72 1256
Kitada, Masahiro Tokyo, JP 36 630
Kobayashi, Toshio Tokyo, JP 260 4062
Koyama, Naoki Kokubunji, JP 43 620
Kugiya, Fumio Hachioji, JP 26 606
Matsuda, Yoshibumi Hachioji, JP 53 1023
Miyamura, Yoshinori Tokyo, JP 27 796
Moriwaki, Eijin Hachioji, JP 20 452
Munemoto, Takayuki Ibaraki-ken, JP 14 370
Nakao, Takeshi Sagamihara, JP 99 1554
Nakatani, Ryoichi Akigawa, JP 34 534
Shiiki, Kazuo Kanagawa-ken, JP 42 771
Shimizu, Noboru Tokorozawa, JP 64 1052
Suzuki, Mikio Kokubunji, JP 173 2839
Takagaki, Tokuho Yokohama, JP 14 350
Takano, Hisashi Hachioji, JP 118 1606
Tanabe, Hideo Higashimurayama, JP 68 819
Yuito, Isamu Ome, JP 34 691

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