Integrated circuit probe card
Number of patents in Portfolio can not be more than 2000
United States of America Patent
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-
Dec 26, 2006
Grant Date -
Feb 2, 2006
app pub date -
Jan 6, 2005
filing date -
Jul 28, 2004
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
The probe card comprises a primary circuit board with a plurality of signal contacts, a probe assembly including a plurality of probes electrically connected to the signal contact and an adjusting assembly for adjusting the coplanarity between the probe assembly and a device under test. The adjusting assembly comprises a groove plate with a plurality of grooves, a wedge positioned in the groove, at least one adjusting pin connecting the wedge and the probe assembly and at least one screw positioned at one side of the wedge. The wedge comprises an inclined surface, and one end of the adjusting pin contacts the inclined surface of the wedge and the other end contacts the probe assembly. The circuit probe card moves the wedge laterally to further move the adjusting pin upwards and downwards, so that to the coplanarity between the probe assembly and the device under test can be adjusted.
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