Interface apparatus for integrated circuit testing

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United States of America Patent

PATENT NO 7141993
APP PUB NO 20040150490A1
SERIAL NO

10468277

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Abstract

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An apparatus and method for coupling a test head and probe card in an IC testing system incorporating patterned divider elements (24) disposed between rows of signal conductors (22) to provide matching characteristic impedance values along each row of signal conductors. The divider elements have a patterned conductive layer formed thereon that is electrically connected to ground, and a method for determining a useful pattern is provided. Test dividers (24) fabricated with openings of various size and shape are used to construct transmission lines. The impedance of these lines is measured, and the results are used to interpolate an appropriate opening size and shape to achieve a desired transmission line impedance.

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Patent Owner(s)

Patent OwnerAddress
INTEST CORPORATION7 ESTERBROOK LANE CHERRY HILL NJ 08003

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Daniels, Stuart F Moorestown, NJ 4 29
Sargent, IV Thornton W Sutter Creek, CA 5 55
Smith, Douglas W Los Altos, CA 36 503

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges16372195833019201010571401 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0255075100125150175200225250275300325350375400

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