Hierarchically-controlled automatic test pattern generation
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United States of America Patent
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Nov 21, 2006
Grant Date -
Aug 5, 2004
app pub date -
Dec 17, 2002
filing date -
Dec 17, 2002
priority date (Note) -
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Abstract
Hierarchically-controlled automatic test pattern generation (ATPG) is provided. One embodiment comprises a method for automatically generating test patterns for testing a device under test. Briefly described, one such method comprises the steps of: receiving a hierarchical model of a device under test, the hierarchical model comprising at least one low-level design component and at least one high-level design component which contains the low-level design component; selecting a fault to be detected in the device under test; and performing an automatic test pattern generation (ATPG) algorithm on the design components based on the hierarchy of the hierarchical model.
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