Nanotube probe and method for manufacturing same

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United States of America Patent

PATENT NO 7138627
SERIAL NO

11169380

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A nanotube probe assembled under real-time observation inside an electron microscope, the probe including a nanotube; a holder for holding the nanotube; and a fastening means for fastening the nanotube at a base end portion thereof to the holder; and the tip end portion of the nanotube protrudes from the holder. The method for manufacturing a nanotube probe includes the steps of setting up a nanotube and a holder inside an electron microscope; allowing a base end portion of the nanotube, with a tip end portion thereof protruding, to come into contact with the holder; and irradiating electron beam to the base end portion of the nanotube to form a carbon film at the base end portion of the nanotube, or forming a fused part at the base end portion of the nanotube, thus fastening the base end portion of the nanotube to the holder by the carbon film.

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Patent Owner(s)

Patent OwnerAddress
DAIKEN CHEMICAL CO LTDOSAKA-SHI OSAKA 536-0011

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Akita, Seiji Izumi, JP 15 230
Harada, Akio Osaka, JP 63 715
Nakayama, Yoshikazu Hirakata, JP 82 1163

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