Method of measuring density properties of a particle distribution
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United States of America Patent
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Nov 7, 2006
Grant Date -
Jun 2, 2005
app pub date -
Aug 20, 2002
filing date -
Aug 20, 2001
priority date (Note) -
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Abstract
A method and a device for measuring density properies of a particle distribution, in which method a first parameter relating to the particle distribution is measured at a first measuring point (302), at least part of the flow that passed through the first measuring point is guided to the second measuring point (304), a second parameter relating to the particle distribution is measured at a second measuring point (305), and said first and second parameters relating to the particle distribution are used to determine at least one density property of the particle distribution of the original flow (306).
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