Method of manufacturing Group III nitride crystal substrate, etchant used in the method, Group III nitride crystal substrate, and semiconductor device including the same

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United States of America Patent

PATENT NO 7125801
APP PUB NO 20050059229A1
SERIAL NO

10911939

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Abstract

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The present invention provides a Group III nitride crystal substrate whose surface has concavities and convexities reduced in size. The surfaces with concavities and convexities, such as hillocks, pits and facets, of Group III nitride crystals are brought into contact with a melt and thereby the surfaces are subjected to meltback etching or mechanochemical polishing. The melt includes at least one of alkali metal and alkaline-earth metal. Thus a Group III nitride crystal substrate that has reduced strain and a reduced number of defects, which are caused through the processing, and is excellent in surface flatness is manufactured. Furthermore, by the use of the Group III nitride crystal substrate of the present invention, for instance, semiconductor devices of high performance can be obtained.

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Patent Owner(s)

Patent OwnerAddress
MATSUSHITA ELECTRIC INDUSTRIAL CO LTDOSAKA JAPAN OSAKA
YUSUKE MORI8-16-9 KISAICHI KATANO-SHI OSAKA 576-0033

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kawamura, Fumio Minoh, JP 87 965
Kidoguchi, Isao Kawanishi, JP 119 1434
Kitaoka, Yasuo Ibaraki, JP 97 1214
Minemoto, Hisashi Hirakata, JP 52 587
Mori, Yusuke Katano, JP 205 925
Sasaki, Takatomo Suita, JP 64 492

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