Elevation beam pattern variation for ultrasound imaging

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United States of America Patent

PATENT NO 7097619
SERIAL NO

10403259

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Abstract

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Methods and systems vary the elevation beam pattern during an imaging session. A user based or automatic search mode is provided where one or more elevation beam thicknesses are used, and then a diagnosis mode is provided where an optimal or narrow elevation beam thickness is used for continued imaging. 1.25, 1.5, 1.75 and 2D arrays are used to obtain frames of data responsive to the varied elevation beam pattern.

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Patent Owner(s)

Patent OwnerAddress
SIEMENS MEDICAL SOLUTIONS USA INC40 LIBERTY BLVD MALVERN PA 19355

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Freiburger, Paul D Seattle, WA 15 587
Von, Behren Patrick L Bellevue, WA 14 607

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