Methods and apparatus for early fault detection and alert generation in a process
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United States of America Patent
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Aug 22, 2006
Grant Date -
Dec 4, 2003
app pub date -
May 30, 2002
filing date -
May 30, 2002
priority date (Note) -
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Abstract
A method and apparatus for providing early fault detection and alert generation in a multi-parameter process is provided. The method comprises defining a multi-dimensional space, each dimension representing a parameter of the process; applying an analysis of the process to the space in order to define regions of high and low probability of occurrence; measuring and mapping parameter values onto the space; and generating an alert whenever a parameter value is mapped into a region of low probability. The method and apparatus are also useful for identifying the cause of faults, adjusting the process to avoid faults and predicting a process-specific maintenance schedule.
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