Method and system for testing image sensor system-on-chip
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United States of America Patent
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Aug 1, 2006
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app pub date -
Jul 16, 2002
filing date -
Jul 16, 2002
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Abstract
Methods and systems for testing an image sensor system-on-chip (SOC). For testing an image sensor SOC that integrates a sensor array and an image processing component, defects are being searched separately in the sensor array and the image processing component in order to isolate possible defects of the sensor array from the possible defects of the image processing component. In so doing, the location of the defects can be pin-pointed.
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