Vertical transmission diffraction analysis
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United States of America Patent
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Jul 18, 2006
Grant Date -
Mar 31, 2005
app pub date -
Oct 3, 2002
filing date -
Oct 3, 2001
priority date (Note) -
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Abstract
The present invention relates to a method for performing a transmission diffraction analysis of an analyte on a support surface, wherein the method comprises: irradiating said analyte with a radiation beam generated by a source of radiation, and detecting said radiation after passing through the analyte. The method is characterised in that irradiation is performed such that the radiation beam strikes the analyte in a substantially vertical and substantially perpendicular direction. Further the present invention relates to an apparatus for performing a transmission diffraction analysis.
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