Photonic integrated circuit based planar wavelength meter

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United States of America Patent

PATENT NO 7061610
SERIAL NO

10366953

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Abstract

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A method and device for measuring the wavelength of a source, for example monitoring a laser used in DWDM fiber optic communications systems, wherein the method and device comprise using a coarse arrayed waveguide grating (AWG) to resolve an ambiguity of wavelength measurement in a fine arrayed waveguide grating. The wavelength monitor or meter of the present invention may be configured as a standalone device suitable for use in many different applications and may also be integrated into a laser or laser array for use in DWDM fiber optic communications systems.

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Patent Owner(s)

Patent OwnerAddress
RAINDANCE MICROSYSTEMS LLC2840 CREEK VIEW COURT PROSPER TX 75078

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Hongmin Worcester, MA 44 295
Mittelstein, Michael Laguna Niguel, CA 30 1023

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