Method and system for increasing yield of vertically integrated devices
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
Jun 6, 2006
Grant Date -
Dec 2, 2004
app pub date -
Nov 20, 2003
filing date -
Nov 20, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A method for increasing the manufacturing yield for a vertically integrated device is disclosed. The devices are composed of one or more multiple layer die. The number of functioning layers of each multiple layer die is determined diagnostically. Each of said multiple layer die are sorted based on said number of functioning layers. Also disclosed are methods for combining sorted die, and methods for slicing sorted die, to form die with a desired number of known good layers.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully