Probe device for electrical testing an integrated circuit device and probe card using the same

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 7053636
APP PUB NO 20050200375A1
SERIAL NO

10709723

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present probe device comprises an insulative body, at least one supporter positioned in the insulative body, a probe positioned substantially at the center of the supporter, and a conductive wire positioned in the insulative body and electrically connected to the supporter. The supporter can be a helical spring, which connects to the probe with its inner end and to the insulative body with its outer end. In addition, the supporter may include a plurality of beams, which connects to the probe at one end and to the insulative body at the other end. The beams are positioned in a radial manner with the probe at the center, and the included angle between two adjacent beams is substantially the same. The supporter can further comprise at least one ring connecting the plurality of beams.

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Patent Owner(s)

Patent OwnerAddress
MPI CORPORATIONNO 155 CHUNG-HO ST CHU-PEI CITY HSINCHU SHIEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sudin, Hendra Chu-Pei, TW 5 86

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  • 2 Citation Count
  • G01R Class
  • 2.05 % this patent is cited more than
  • 19 Age
Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges16372195833019201010571401 - 1011 - 2021 - 3031 - 4041 - 5051 - 6061 - 7071 - 8081 - 9091 - 100100 +0255075100125150175200225250275300325350375400

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