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• 15 United States
• 10 France
• 8 Japan
• 7 China
• 5 Korea
• 2 Other

Patent Owner(s)

Patent Owner	Address
ROCKTEK LIMITED	PINJARRA W A 6208

International Classification(s)

• F42B:EXPLOSIVE CHARGES, e.g. FOR BLASTING; FIREWORKS; A....

• 2001 Application Filing Year
• F42B Class
• 238 Applications Filed
• 84 Patents Issued To-Date
• 35.30 % Issued To-Date

Inventor(s)

Inventor Name	Address	# of filed Patents	Total Citations
Gavrilovic, Mihailo	Denver, CO	8	90
# of filed Patents : 8 Total Citations : 90
Micke, Brian P	Golden, CO	4	31
# of filed Patents : 4 Total Citations : 31
Wright, Keith W	Dianella, AU	2	10
# of filed Patents : 2 Total Citations : 10

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Patent Citation Ranking

• 2 Citation Count
• F42B Class

• 5.31 % this patent is cited more than
• 19 Age

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Maintenance Fees

Fee	Large entity fee	small entity fee	micro entity fee	due date

Fee	Large entity fee	small entity fee	micro entity fee
Surcharge after expiration - Late payment is unavoidable	$700.00	$350.00	$175.00
Surcharge after expiration - Late payment is unintentional	$1,640.00	$820.00	$410.00

DATE PUBLISHED	PUBLICATION/PATENT NO.	PUBLICATION TYPE
May 23, 2006	US,7047886,B2   US7047886B2	GRANTED PATENT AS SECOND PUBLICATION
September 05, 2002	US,20020121213,A1   US20020121213A1	FIRST PUBLISHED PATENT APPLICATION

Full Text

US Patent No: 8869602

High frequency deflection measurement of IR absorption

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Abstract

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An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface by using the AFM probe to detect wavelength dependent IR radiation interaction, typically absorption with the sample in the region of the tip. The tip may be configured to produce electric field enhancement when illuminated by a radiation source. This enhancement allows for significantly reduced illumination power levels resulting in improved spatial resolution by confining the sample-radiation interaction to the region of field enhancement which is highly localized to the tip.

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Description

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Claims

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• P2013
• F2012
• AS2012

Date	Code	Event	Description
Jul 15, 2024	LAPS	LAPSE FOR FAILURE TO PAY MAINTENANCE FEES	free format text: PATENT EXPIRED FOR FAILURE TO PAY MAINTENANCE FEES (ORIGINAL EVENT CODE: EXP.); ENTITY STATUS OF PATENT OWNER: SMALL ENTITY
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Jun 07, 2016	I	Issuance
May 18, 2016	STCF	INFORMATION ON STATUS: PATENT GRANT	free format text: PATENTED CASE
Feb 22, 2016	ZAAB	NOTICE OF ALLOWANCE MAILED	free format text: ORIGINAL CODE: MN/=.
Feb 22, 2016	ZAAA	NOTICE OF ALLOWANCE AND FEES DUE	free format text: ORIGINAL CODE: NOA
Nov 07, 2013	P	Published
Jun 19, 2012	F	Filing
Jun 18, 2012	AS	ASSIGNMENT	free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:VREEKEN, STEVEN GERRIT;NIXON, TIMOTHY JAMES;REEL/FRAME:028402/0813 Owner name: TRANSNAV INC., MICHIGAN Effective Date: Jun 18, 2012