Indirect techniques for measuring 1/f noise
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United States of America Patent
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May 16, 2006
Grant Date -
N/A
app pub date -
Oct 25, 2000
filing date -
Jul 5, 2000
priority date (Note) -
Expired
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Abstract
The time required to measure 1/f noise for a device, such as an integrated circuit, can be shortened by applying offset to a chopper stabilized circuit and then using offset removal as a surrogate measure for 1/f noise performance.
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