Systems and methods for facilitating testing of pads of integrated circuits
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United States of America Patent
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May 9, 2006
Issued Date -
N/A
app pub date -
Jun 18, 2003
filing date -
Mar 8, 2002
priority date (Note) -
Expired
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Abstract
Methods for testing integrated circuits (ICs) are provided. An embodiment of a method comprises: electrically interconnecting automated test equipment (ATE) with the IC; providing at least one stimulus such that the IC determines the presence of a leakage current of the first pad; and receiving information corresponding to the leakage current of the first pad. Systems also are provided.
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