Method and system for testing a computing arrangement
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United States of America Patent
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Apr 18, 2006
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N/A
app pub date -
Jun 6, 2002
filing date -
Jun 6, 2002
priority date (Note) -
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Abstract
A method and apparatus for testing a computing arrangement. In various embodiments, a plurality of parameter definitions are established, including a static-value parameter and a dynamic-value parameter. A plurality of sets of parameter values are established in association with the parameter definitions. A results storage area has portions respectively associated with the sets of parameter values. A test program is associated with the parameter definitions and is configured to execute using one set of parameter values at a time. The test program inputs a parameter value associated with a static parameter, automatically generates a value for each dynamic parameter, and exercises the computing arrangement using the parameter values in a set, the value of each parameter affecting behavior of the computing arrangement via the test program. The test program further stores data resulting from execution of the test program in portions of the results storage area respectively associated with the sets of parameter values. In another embodiment, a feedback mechanism adjusts parameter values in the sets to automate the process of constructing suitable sets of values.
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