Method of analysis of samples by determination of a function of specific brightness
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United States of America Patent
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Mar 28, 2006
Grant Date -
Jan 16, 2003
app pub date -
Nov 10, 1997
filing date -
Oct 12, 1996
priority date (Note) -
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Abstract
A method for characterizing samples having units, by monitoring fluctuating intensities of radiation emitted, scattered and/or reflected by said units in at least one measurement volume, the monitoring being performed by at least one detection means, said method comprising the steps of: a) measuring in a repetitive mode a number of photon counts per time interval of defined length, b) determining a function of the number of photon counts per said time interval, c) determining a function of specific brightness of said units on basis of said function of the number of photon counts.
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