Process for long crystal lateral growth in silicon films by UV and IR pulse sequencing

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United States of America Patent

PATENT NO 7018468
SERIAL NO

10713383

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Abstract

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A process of lateral crystallization is provided for increasing the lateral growth length (LGL). A localized region of the substrate is heated for a short period of time. While the localized region of the substrate is still heated, a silicon film overlying the substrate is irradiated to anneal the silicon film to crystallize a portion of the silicon film in thermal contact with the heated substrate region. A CO2 laser may be used as a heat source to heat the substrate, while a UV laser or a visible spectrum laser is used to irradiate and crystallize the film.

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Patent Owner(s)

Patent OwnerAddress
SHARP KABUSHIKI KAISHA1 TAKUMI-CHO SAKAI-KU SAKAI CITY OSAKA 5908522 ?5908522

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Crowder, Mark A Portland, OR 36 754
Sposili, Robert S Portland, OR 27 799
Voutsas, Apostolos T Vancouver, WA 102 1184

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