Gain profile measuring method and system and gain profile controlling method and system

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United States of America Patent

PATENT NO 7009693
SERIAL NO

10455869

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Abstract

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To control a gain profile in an optical fiber line to become a desirable form, a C-OTDR measuring apparatus (36) outputs a probe pulse light having a wavelength λm for an optical fiber line (14). A power level on the input or output side of a variable gain equalizer (22) can be measured according to a C-OTDR waveform of a return light of the probe pulse light entered through a C-OTDR path (20c) and an optical fiber line (16). By sweeping the measurement wavelength λm, the gain file is measured. The equalizing characteristics of the variable gain equalizer (22) are remotely controlled so that the gain profile becomes a desirable form according to the measured result.

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Patent Owner(s)

Patent OwnerAddress
MITSUBISHI DENKI KABUSHIKI KAISHA2-3 MARUNOUCHI 2-CHOME CHIYODA-KU TOKYO
KDDI SUBMARINE CABLE SYSTEMS INCTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Goto, Koji Tokyo, JP 70 865
Kawazawa, Toshio Tokyo, JP 14 174
Takashina, Kiyoaki Tokyo, JP 1 19

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