Circuit arrangement and method for controlling and evaluating signal detectors
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United States of America Patent
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Feb 14, 2006
Grant Date -
Jul 10, 2003
app pub date -
Dec 17, 2002
filing date -
Aug 23, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A circuit arrangement (10) for activating a sensor and evaluating its signals, in particular for parametric sensors with complex impedances. The circuit arrangement comprises at least one sensor (2) for acquiring mechanical data. In order to minimize or largely prevent temperature caused disturbances in a constructionally simple layout, the measuring signal, the absolute temperature, and the gradient temperature of the sensor (2) are acquired simultaneously, preferably by means of a microprocessor or microcomputer (3). A corresponding method for activating sensors and evaluating their signals is also described.
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