Method and apparatus for testing a high speed data receiver for jitter tolerance
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United States of America Patent
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Jan 10, 2006
Grant Date -
Mar 4, 2004
app pub date -
Aug 27, 2002
filing date -
Aug 27, 2002
priority date (Note) -
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Abstract
A method and apparatus is presented for measuring jitter tolerance in a device under test. A device under test is established to operate at a specific frequency. A bit pattern is generated from a bit pattern generator. The bit pattern generated by the bit pattern generator is produced at a frequency that is a multiple of the frequency that the device under test is operating under. Bits are systematically changed in the bit pattern and then errors are measured in the device under test. As a result, the jitter tolerance of the device under test is measured.
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