Systems and methods for facilitating testing of pad drivers of integrated circuits
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Jan 10, 2006
Grant Date -
Sep 11, 2003
app pub date -
Mar 8, 2002
filing date -
Mar 8, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Integrated circuits (ICs) are provided. A representative IC includes a first pad electrically communicating with at least a portion of the IC. The first pad includes a first driver and a first receiver, with the first driver being configured to provide a first pad output signal to a component external to the IC, and the first receiver being configured to receive a first pad input signal from a component external to the IC. The first receiver also is configured to provide, to a component internal to the IC, a first receiver digital output signal in response to the first pad input signal. A first test circuit also is provided that is internal to the IC. The first test circuit is adapted to provide information corresponding to the driver tristate leakage current of the first pad. Methods, computer-readable media, systems and other ICs also are provided.
First Claim
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