Optical coupling for testing integrated circuits
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United States of America Patent
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Jan 10, 2006
Grant Date -
Aug 22, 2002
app pub date -
Dec 21, 2000
filing date -
Dec 21, 2000
priority date (Note) -
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status (Latency Note)
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Abstract
A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focussing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.
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