Multi-function probe card
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United States of America Patent
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Jan 10, 2006
Grant Date -
Aug 25, 2005
app pub date -
Jul 21, 2004
filing date -
Feb 24, 2004
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A multi-function probe card (40) includes a PCB (41), a plurality of probe needles (47), a counter (71) to acquire a 'piece sequence parameter', a signal-measuring device (72) via the probe needles (71) to acquire a current, and a voltage parameters etc. as well as a parametric processing system (74). The parametric processing system (74) includes an I/O unit (51)/(59), a processing unit (52), a time providing unit (55), a real time display unit (56), and a storing unit (57). Moreover, the piece sequence parameter, current parameter, and voltage parameter can be input into the processing unit (52) through the I/O unit (51)/(59). Thereafter, a parametric data structure can be set up to record and calculate in accordance with the datum and parameters, and finally to display service processes and conditions of the probe card (40) through the real time display unit (56).
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