Sample analysis systems
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United States of America Patent
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Jan 3, 2006
Grant Date -
Jul 10, 2003
app pub date -
Aug 13, 2002
filing date -
Aug 31, 1998
priority date (Note) -
Expired
status (Latency Note)
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Abstract
Systems, and components thereof, for analyzing samples. These systems include apparatus and methods for generating, transmitting, detecting, and/or analyzing light, including without limitation high-throughput optical screening devices for analyzing samples at one or more assay sites. These systems also include apparatus and methods for supporting samples for analysis, including without limitation multiwell sample holders such as microplates.
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