Process for producing an SPM sensor

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United States of America Patent

PATENT NO 6979407
APP PUB NO 20030196988A1
SERIAL NO

10385088

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Abstract

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Process for producing an SPM sensor having a holding element, a cantilever and a sensor tip which projects out of the surface of the cantilever and is delimited by three surfaces. According to the process, the starting material used is a (100)-silicon wafer. The main patterning process steps are carried out on the wafer back surface, so that an SPM sensor can be produced at low cost in a single batch run.

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Patent Owner(s)

Patent OwnerAddress
NANOWORLD AGJAQUET-DROZ 1 NEUCHATEL CH-2007

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Lutter, Stefan Nauchâtel, CH 9 34

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