Method and apparatus for measuring the lifetime of an excited state in a specimen

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United States of America Patent

PATENT NO 6975394
APP PUB NO 20020057430A1
SERIAL NO

09987364

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Abstract

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An apparatus for measuring the lifetime of an excited state in a specimen is disclosed. The apparatus comprises an electromagnetic energy source (1) that emits light (3) of one wavelength. Also provided are a means (5) for dividing the light (3) into at least a first and a second partial light beam (7, 9) and an intermediate element (23) in at least one partial light beam to influence the transit time.

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Patent Owner(s)

Patent OwnerAddress
LEICA MICROSYSTEMS HEIDELBERG GMBHIM NEUENHEIMER FELD 518 HEIDELBERG D-691

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Engelhardt, Johann Bad Schoenborn, DE 116 1287

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