Method for determining a refractive index

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United States of America Patent

PATENT NO 6967714
APP PUB NO 20030179365A1
SERIAL NO

10240221

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The matter for which the refractive index is to be determined, is made available in the form of a theoretically determinable scattering or diffraction pattern. Two or more orders of diffraction may then be defined to form at least one intensity ratio. At least one intensity distribution may be formed by irradiating the scattering pattern using one light beam of a defined shape. Subsequently thereto, the intensity ratio may be formed based on the orders of diffraction of the intensity distribution. In addition, at least one portion of a characteristic curve may be determined, which represents the dependency of the intensity ratio on the refractive index, and, with whose assistance, the corresponding refractive index can be assigned to the intensity ratio formed.

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Patent Owner(s)

Patent OwnerAddress
NAWOTEC GMBHINDUSTRIESTR 1 64380 ROSSDORF

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kaya, Alexander Darmstadt, DE 5 31
Koops, Hans W P Ober-Ramstadt, DE 12 218
Leminger, Ottokar Darmstadt, DE 1 3

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