Refractive focusing element for spectroscopic ellipsometry
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United States of America Patent
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Sep 6, 2005
Issued Date -
N/A
app pub date -
Oct 18, 2004
filing date -
May 15, 2000
priority date (Note) -
Expired
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Abstract
A broadband ellipsometer is disclosed with an all-refractive optical system for focusing a probe beam on a sample. The ellipsometer includes a broadband light source emitting wavelengths in the UV and visible regions of the spectrum. The change in polarization state of the light reflected from the sample is arranged to evaluate characteristics of a sample. The probe beam is focused onto the sample using a composite lens system formed from materials transmissive in the UV and visible wavelengths and arranged to minimize chromatic aberrations. The spot size on the sample can be less than 3 mm and the aberration is such that the focal shift over the range of wavelengths is less than five percent of the mean focal length of the system.
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