Integrated circuit that can be externally tested through a normal signal output pin
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United States of America Patent
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Aug 30, 2005
Issued Date -
N/A
app pub date -
Jul 8, 2004
filing date -
Dec 22, 2000
priority date (Note) -
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Abstract
An integrated circuit can be tested externally at its normal signal output pin(s) without requiring additional testing output pins or test measuring pads. The integrated circuit includes a circuit unit that generates a normal output signal provided to the signal output pin in a normal operating mode and generates a test signal in a testing mode, a switching element that selectively does or does not connect the test signal from the circuit unit to the signal output pin, and a control unit that controls the switching element with a control signal responsive to the potential level present at the signal output pin. When the circuit is to be tested, a defined voltage is applied to the signal output pin by a voltage divider formed of resistors between a supply voltage and a reference voltage. This causes the control unit to close the switching element.
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