Methods and devices for aligning and determining the focusing characteristics of x-ray optics
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United States of America Patent
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Aug 30, 2005
Grant Date -
Aug 5, 2004
app pub date -
Jan 23, 2004
filing date -
Jul 27, 2001
priority date (Note) -
Expired
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Abstract
Methods and devices for aligning an x-ray optic with a source of x-rays and methods and devices for determining a focusing characteristic of an x-ray optic are provided. The methods and devices simplify the process of aligning an x-ray optic device (for example, a polycapillary x-ray optic) to an x-ray source or for measuring a focusing characteristic, for example, the focal length or beam shape, of an x-ray optic. In one aspect, the device includes a housing having a first aperture adapted for receiving an x-ray optic and a surface having an x-ray flourescent material from which visual fluorescence occurs when impinged by x-rays. The size and shape of fluorescence from the surface may be varied by moving the surface to determine, for example, the focal length of the x-ray optic.
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