Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal
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United States of America Patent
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Aug 23, 2005
Grant Date -
Mar 4, 2004
app pub date -
Feb 12, 2003
filing date -
Aug 30, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A jitter measurement circuit includes: a conversion section sampling one of a reference signal and a measurement target signal in response to the other of the signals, thereby obtaining a sampling data string; and a determination section measuring jitter of the measurement target signal on the basis of the sampling data string obtained by the conversion section. Since the reference signal is a stable signal having a predetermined cycle, the sampling data string as a measurement result depends on the measurement target signal. Therefore, it is possible to simply measure jitter level in accordance with irregularity of the measurement result and on the basis of relative measurement to expected value data.
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