Imaging X-ray detector based on direct conversion
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
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Aug 23, 2005
Grant Date -
Jan 15, 2004
app pub date -
Jun 11, 2003
filing date -
Jun 27, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An X-ray detector (401, 501, 601) has a detecting element that comprises a semiconductor heterostructure where an undoped Germanium layer (402, 502) is enclosed between two oppositely doped Gallium Arsenide layers (403, 404, 503, 505).
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
- OXFORD INSTRUMENTS ANALYTICAL OY
International Classification(s)

- 2003 Application Filing Year
- G01T Class
- 251 Applications Filed
- 115 Patents Issued To-Date
- 45.82 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
Bourgoin, Jacques | Avon, FR | 6 | 39 |
# of filed Patents : 6 Total Citations : 39 | |||
Sipila, Heikki Johannes | Espoo, FI | 16 | 131 |
# of filed Patents : 16 Total Citations : 131 |
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Patent Citation Ranking
- 16 Citation Count
- G01T Class
- 54.63 % this patent is cited more than
- 20 Age
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Maintenance Fees
Fee | Large entity fee | small entity fee | micro entity fee | due date |
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Fee | Large entity fee | small entity fee | micro entity fee |
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Surcharge after expiration - Late payment is unavoidable | $700.00 | $350.00 | $175.00 |
Surcharge after expiration - Late payment is unintentional | $1,640.00 | $820.00 | $410.00 |
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