Two-stage actuation clamp for electrical device under test (DUT) with DUT-linked double action
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United States of America Patent
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Aug 16, 2005
Grant Date -
Dec 30, 2004
app pub date -
Jun 24, 2003
filing date -
Jun 24, 2003
priority date (Note) -
Expired
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Abstract
A novel two-stage clamp used in testing a device-under-test (DUT) is herein presented. The two-stage clamp provides two sequential actuations via one linear force, and includes clamps moving in multiple different directions. The two-stage clamp uniquely uses the DUT being clamped to provide the linkage and timing for the two-stage actuation of clamps moving in three different directions.
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