Flexible vector network analyzer measurements and calibrations
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United States of America Patent
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Aug 9, 2005
Grant Date -
Aug 5, 2004
app pub date -
Aug 15, 2003
filing date -
Jan 30, 2003
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Abstract
Methods, systems and computer program products for efficiently characterizing devices under test (DUTs) using a vector network analyzer (VNA) are provided. A N-port DUT can be divided as appropriate into multiple sub-devices, or multiple separate devices can be present. A parent calibration is performed. The VNA is then used to determine the S-parameters of interest for each sub-device or separate device, preferably without measuring S-parameters that are not of interest. This can include measuring S-parameters and removing corresponding error coefficients determined during the parent calibration.
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