Enhancing polarized light microscopy
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United States of America Patent
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Aug 2, 2005
Grant Date -
Jul 1, 2004
app pub date -
May 12, 2003
filing date -
May 13, 2002
priority date (Note) -
Expired
status (Latency Note)
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Abstract
A microscope system for determining optical properties of a specimen includes a source of polarized light, a detector for detecting the intensity of light incident thereon, an optical path extending from the source to the detector, a condenser for providing light from the source to the specimen, an objective for receiving light from the specimen, a support for mounting the specimen, a sectored variable retarder mounted in the optical path, and a polarized light analyzer mounted in the path between the sectored variable retarder and the detector. The variable retarder has a multiple sectors. Each sector is individually addressable by a control signal that affects the light retardation characteristics of the sector.
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