Defect type classifying method
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United States of America Patent
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Aug 2, 2005
Grant Date -
Nov 14, 2002
app pub date -
Apr 26, 2002
filing date -
Mar 19, 1999
priority date (Note) -
Expired
status (Latency Note)
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Abstract
The invention relates to a method for non-destructive testing of materials, in which at least two differently guided waves (modes) are produced in the solid body, each at at least one specified angle, the measured reflection values are placed in relation to a reference echo in order to obtain a relative reflection value, and the relative reflection values of the individual modes are again placed in relation to one another, thereby enabling the size and type of the defects to be determined.
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