Automatic optical measurement method

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United States of America Patent

PATENT NO 6922247
APP PUB NO 20030147081A1
SERIAL NO

10333990

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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In an automatic optical measurement method according to the invention, with a movable reflection plate 6 moved to place under an optical axis, light projected from a light projecting portion 3a is received by a light receiving portion 3b via the movable reflection plate 6, a stationary reflection plate 11 and the movable reflection plate 6, whereas with the movable reflection plate 6 moved away from the optical axis and a reference 8 set on a sample stage 10, light projected from the light projecting portion 3a is received by the light receiving portion 3b via the reference 8 whereby a ratio between the intensities of the received lights is determined. During a sample measurement, light projected from the light projecting portion 3a with the movable reflection plate 6 moved to place under the optical axis is received by the light receiving portion 3b via the movable reflection plate 6, stationary reflection plate 11 and movable reflection plate 6 so that the intensity of light thus received and the above ratio are used for estimating an intensity of light to be measured with the reference, the estimated intensity of light being used for correcting an intensity of light received via a sample.

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Patent Owner(s)

Patent OwnerAddress
OTSUKA ELECTRONICS CO LTDJAPAN'S OSAKA TIAN RECRUIT MENTION HIRAKATA LAST THREE 26 TIMES 3 CHOME HIRAKATA-SHI OSAKA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fujimura, Shinji Shiga, JP 4 17
Inamoto, Naoki Kumamoto, JP 4 235
Sawamura, Yoshimi Kyoto, JP 2 10
Taguchi, Kunikazu Hirakata, JP 8 22

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