Methods and systems for measuring local scattering and aberration properties of optical media

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United States of America Patent

PATENT NO 6905210
APP PUB NO 20040119942A1
SERIAL NO

10725130

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Methods, systems, and media relating the display of scattering and/or absorption characteristics of an optical medium. For scattering measurements, a Hartmann-Shack calibration image of a measurement system is acquired to define a first plurality of point spread functions. A Hartmann-Shack test image of the medium is acquired to define a second plurality of point spread functions. A shift is determined between the test image and the calibration image. A point spread of each of the second plurality of point spread functions is measured, each of the second plurality of point spread functions including a component due to optical aberration of the medium and a component due to scatter. The component due to optical aberration is determined using the shift. The component due to optical aberration is deconvolved to determine the component due to scatter. A display of the local scattering characteristics is generated using the component due to scatter. For absorption measurements, a plurality of spot intensity measurements are acquired of a medium, each spot intensity measurement including a component due to reflectivity and a component due to absorption. The component due to reflectivity is determined, and the component due to absorption is determined.

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Patent Owner(s)

Patent OwnerAddress
BOARD OF REGENTS THE UNIVERSITY OF TEXAS SYSTEMAUSTIN TX

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Applegate, Raymond A San Antonio, TX 9 573
Thibos, Larry N Bloomington, IN 9 614

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