Multiplexed orthogonal time-of-flight mass spectrometer
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United States of America Patent
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May 31, 2005
Grant Date -
Sep 23, 2004
app pub date -
Mar 21, 2003
filing date -
Mar 21, 2003
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Expired
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Abstract
A mass spectrometer and associated methods analyze an ion beam by accumulating ions for a sequence of time periods, and driving the accumulated ions in pulses. Differing quantities of ions can be accumulated in the sequential pulses according to a psuedo-random sequence, and the slower ions are overtaken by the faster ions of a subsequent pulse. A mass spectrum may be reconstructed from an overlapping ion detector signal using an inverse of a weighted simplex matrix or inverse Hadamard transform techniques.
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