Semiconductor test data analysis system
Number of patents in Portfolio can not be more than 2000
United States of America Patent
Stats
-
May 24, 2005
Grant Date -
Jan 1, 2004
app pub date -
Jun 28, 2002
filing date -
Jun 28, 2002
priority date (Note) -
Expired
status (Latency Note)
Importance
Abstract
A semiconductor test data analysis system (1) automatically recording, during an analysis operation, operation information of the analysis operation, including analysis conditions or an analysis procedure for input test data, or analysis information obtained by the analysis operation. The analysis system includes a processing means (101), an analysis target data storage means (109), which stores the test data as analysis target data, a historical data storage means (107), which stores as historical data either operation information of the analysis operation or analysis information obtained by the analysis operation, and a display data storage means (112), which stores analysis information obtained by the analysis operation, which stores analysis display data generated by the processing means for the purpose of displaying the analysis information obtained by the analysis operation. In this system, when a new analysis operation is specified, the processing means (101) processes the input test data in accordance with the analysis operation, and processes at least one of the analysis target data, historical data, and display data by the new analysis operation.
First Claim
Family
International Classification(s)
Cited Art Landscape
Patent Citation Ranking
Recipient Email Address
Recipient Email Address
Comment
Recipient Email Address
Add to Portfolio(s)
To add this patent to one, or more, of your portfolios, simply click the add button.
This Patent is in these Portfolios:
Add to additional portfolios:
Last Refreshed On:
Changes done successfully