Non-destructive process for continuously measuring the density profile of panels
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United States of America Patent
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May 17, 2005
Grant Date -
Mar 3, 2005
app pub date -
May 20, 2002
filing date -
May 18, 2001
priority date (Note) -
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Abstract
A method for nondestructively measuring the density of a panel, comprising the steps of: directing a collimated radiation beam at the panel at an oblique angle; passing the panel under the collimated radiation beam or passing the collimated radiation beam over the panel; continuously detecting a resultant beam of a plurality of photons with a detector directed at the panel; counting only those photons with an energy level above a minimum energy level; correcting for inaccuracies at the edges of the panel; and generating a density profile of the panel throughout the thickness of the panel.
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