Method for forming a copper thin film

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United States of America Patent

PATENT NO 6887522
APP PUB NO 20020157610A1
SERIAL NO

10132427

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Abstract

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A method for forming a Cu thin film on a substrate includes a Cu-CVD step forming a first copper film on predetermined surface of a substrate by a CVD process and a plating step further forming a second copper film on the first copper film by an eletrolytic copper plating process using the first copper film as an electrode. A modifying step modifies the first copper film by exposing it in an active atmosphere between the Cu-CVD step and the plating step. Fine voids can thereby be effectively prevented from being formed in the vicinity of the interface between the first copper film and the second copper film.

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Patent Owner(s)

Patent OwnerAddress
ANELVA CORPORATION8-1 YOTSUYA 5-CHOME FUCHU-SHI TOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Koide, Tomoaki Tokyo, JP 6 53
Kuninobu, Takafumi Tokyo, JP 15 144
Sekiguchi, Atsushi Tokyo, JP 48 1467
Shibagaki, Masami Tokyo, JP 24 1114
Suzuki, Kaoru Tokyo, JP 126 1790

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