Method for patterning multilevel interconnects

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United States of America Patent

PATENT NO 6875699
SERIAL NO

10138041

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Abstract

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A method of forming a damascene structure above a substrate is provided. A low-k dielectric layer is formed over the substrate, wherein the low-k dielectric layer does not have a trench stop layer. A plurality of vias are etched through the low-k dielectric layer. Via plugs are formed in the plurality of vias. A plurality of trenches are etched into the low-k dielectric layer, wherein the etching with sufficiently high via plugs minimizes facet formation at the tops of vias exposed to the etch and wherein the trench etch process removes fences caused by the via plugs. The via plugs are stripped.

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Patent Owner(s)

Patent OwnerAddress
LAM RESEARCH CORPORATION4650 CUSHING PARKWAY FREMONT CA 94538

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chi, Chiu San Jose, CA 7 159
Lassig, Stephan Danville, CA 5 40
Li, Si Yi Milpitas, CA 6 729
Mountsier, Thomas W San Jose, CA 15 2310
Pohray, Vinay Fremont, CA 7 41
Sadjadi, S M Reza Saratoga, CA 74 1490

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