Process for measuring the surface of a polished precious stone
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United States of America Patent
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Mar 22, 2005
Grant Date -
Jun 12, 2003
app pub date -
Nov 22, 2002
filing date -
Dec 12, 2001
priority date (Note) -
Expired
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Abstract
Process for the measurement of the surface of a polished precious stone, wherein firstly the position of at least some of the flat facet surfaces of the stone is measured in space, in particular by rotating the stone in front of a light source and examination of the shadow cast by the stone, and the facet surface is then observed under direct light.
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