Method of detecting a pattern and an apparatus thereof

Number of patents in Portfolio can not be more than 2000

United States of America Patent

PATENT NO 6868354
APP PUB NO 20040111230A1
SERIAL NO

10715444

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Abstract

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An alignment mark is sometimes undetectable even when part of it is visible with the eye. There is provided a pattern detecting method and an apparatus capable of detecting the alignment mark if part of it is visible. Thereby a position of the alignment mark can be detected. An image of a substantially whole of the alignment mark is registered as a representative image and besides at least one image of a part of the registered representative image is newly registered as a partial image. When any one of the registered representative image and the partial image is recognized. The pattern based on the alignment mark is detected. Thereby position coordinates can be recognized.

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Patent Owner(s)

Patent OwnerAddress
V TECHNOLOGY CO LTDYOKOHAMA JAPAN'S KANAGAWA PREFECTURE IN HODOGAYA DISTRICT OF KOBE 134 YOKOHAMA-SHI KANAGAWA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Iyori, Kiyoshi Kodaira, JP 2 9
Kosuge, Shogo Tachikawa, JP 5 25
Nogami, Masaru Kodaira, JP 5 208

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