Semiconductor processing chamber substrate holder method and structure

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United States of America Patent

PATENT NO 6865065
SERIAL NO

10054373

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Abstract

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A method and system for processing wafers is disclosed. According to one embodiment (100) a chuck system (102) may be situated opposite to an input source (104). A chuck system (102) may apply a force (e.g., mechanical and/or electromagnetic) that deforms a substrate (108). Once deformed, essentially all of a substrate (108) may be oriented at a predetermined angle (e.g., 90.degree.) with respect to an input source (104).

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Patent Owner(s)

Patent OwnerAddress
ADVANCED ION BEAM TECHNOLOGY INC116 SOUTH WOLFE ROAD SUNNYVALE CA 94086

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chen, Jihliang Saratoga, CA 1 2
Chen, Jiong San Jose, CA 61 573
Qiao, Jianmin Fremont, CA 18 805

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