Electrical test probe flexible spring tip
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United States of America Patent
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Mar 8, 2005
Grant Date -
May 2, 2002
app pub date -
Dec 13, 2001
filing date -
Jul 31, 2000
priority date (Note) -
Expired
status (Latency Note)
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Abstract
An electrical test probe tip, comprising a conductive flexible coil having a first end and a second end. The first end is for flexibly coupling with a device to be probed. The second end is attached to a connector. The connector may be an integral connection with a probing head or may be a connecting pin. Multiple test probe spring tips may be used to simultaneously probe signal and ground reference points. The present invention is also directed to a method for using the flexible spring tip.
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